Nirmala, Devi M, Department of Electronics and Communication Engineering, Amrita School of Engineering, Coimbatore, Amrita Vishwa Vidyapeetham, India, India

• Vol 68, No 4 (2022) - Security, Safety, Military
  Lightweight PUF-Based Gate Replacement Technique to Reduce Leakage of Information through Power Profile Analysis
  Abstract  PDF

International Journal of Electronics and Telecommunications
is a periodical of Electronics and Telecommunications Committee
of Polish Academy of Sciences

eISSN: 2300-1933