Krawczyk, Rafał, Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland and CERN, Geneva, Switzerland, Poland

• Vol 67, No 1 (2021) - Fusion, HEP and XFEL electronics
  Measurement capabilities upgrade of GEM soft X-ray measurement system for hot plasma diagnostics
  Abstract  PDF

International Journal of Electronics and Telecommunications
is a periodical of Electronics and Telecommunications Committee
of Polish Academy of Sciences

eISSN: 2300-1933